Amit Jakati, Manish Sharma, Joy Liao. Innovative Practices on Software and Hardware based Silicon Debug/Fault Isolation. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1, IEEE, 2019. [doi]
@inproceedings{JakatiSL19,
title = {Innovative Practices on Software and Hardware based Silicon Debug/Fault Isolation},
author = {Amit Jakati and Manish Sharma and Joy Liao},
year = {2019},
doi = {10.1109/VTS.2019.8758654},
url = {https://doi.org/10.1109/VTS.2019.8758654},
researchr = {https://researchr.org/publication/JakatiSL19},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019},
publisher = {IEEE},
isbn = {978-1-7281-1170-4},
}