Sri Jandhyala, Hari Balachandran, Manidip Sengupta, Anura P. Jayasumana. Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 444-452, IEEE Computer Society, 2000. [doi]
@inproceedings{JandhyalaBSJ00,
title = {Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs},
author = {Sri Jandhyala and Hari Balachandran and Manidip Sengupta and Anura P. Jayasumana},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/vts/2000/0613/00/06130444abs.htm},
tags = {rule-based, classification, testing},
researchr = {https://researchr.org/publication/JandhyalaBSJ00},
cites = {0},
citedby = {0},
pages = {444-452},
booktitle = {18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada},
publisher = {IEEE Computer Society},
isbn = {0-7695-0613-5},
}