Sri Jandhyala, Hari Balachandran, Manidip Sengupta, Anura P. Jayasumana. Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 444-452, IEEE Computer Society, 2000. [doi]
Abstract is missing.