Vandana Pursnani Janeja, Vijayalakshmi Atluri. FS:::3:::: A Random Walk Based Free-Form Spatial Scan Statistic for Anomalous Window Detection. In Proceedings of the 5th IEEE International Conference on Data Mining (ICDM 2005), 27-30 November 2005, Houston, Texas, USA. pages 661-664, IEEE Computer Society, 2005. [doi]
@inproceedings{JanejaA05,
title = {FS:::3:::: A Random Walk Based Free-Form Spatial Scan Statistic for Anomalous Window Detection},
author = {Vandana Pursnani Janeja and Vijayalakshmi Atluri},
year = {2005},
doi = {10.1109/ICDM.2005.71},
url = {http://doi.ieeecomputersociety.org/10.1109/ICDM.2005.71},
tags = {rule-based},
researchr = {https://researchr.org/publication/JanejaA05},
cites = {0},
citedby = {0},
pages = {661-664},
booktitle = {Proceedings of the 5th IEEE International Conference on Data Mining (ICDM 2005), 27-30 November 2005, Houston, Texas, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2278-5},
}