FS:::3:::: A Random Walk Based Free-Form Spatial Scan Statistic for Anomalous Window Detection

Vandana Pursnani Janeja, Vijayalakshmi Atluri. FS:::3:::: A Random Walk Based Free-Form Spatial Scan Statistic for Anomalous Window Detection. In Proceedings of the 5th IEEE International Conference on Data Mining (ICDM 2005), 27-30 November 2005, Houston, Texas, USA. pages 661-664, IEEE Computer Society, 2005. [doi]

Abstract

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