A Low-Power Enhanced Bitmask-Dictionary Scheme for Test Data Compression

Vahid Janfaza, Payman Behnam, Bahjat Forouzandeh, Bijan Alizadeh. A Low-Power Enhanced Bitmask-Dictionary Scheme for Test Data Compression. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014. pages 220-225, IEEE, 2014. [doi]

@inproceedings{JanfazaBFA14,
  title = {A Low-Power Enhanced Bitmask-Dictionary Scheme for Test Data Compression},
  author = {Vahid Janfaza and Payman Behnam and Bahjat Forouzandeh and Bijan Alizadeh},
  year = {2014},
  doi = {10.1109/ISVLSI.2014.103},
  url = {http://dx.doi.org/10.1109/ISVLSI.2014.103},
  researchr = {https://researchr.org/publication/JanfazaBFA14},
  cites = {0},
  citedby = {0},
  pages = {220-225},
  booktitle = {IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014},
  publisher = {IEEE},
}