Vahid Janfaza, Payman Behnam, Bahjat Forouzandeh, Bijan Alizadeh. A Low-Power Enhanced Bitmask-Dictionary Scheme for Test Data Compression. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014. pages 220-225, IEEE, 2014. [doi]
@inproceedings{JanfazaBFA14, title = {A Low-Power Enhanced Bitmask-Dictionary Scheme for Test Data Compression}, author = {Vahid Janfaza and Payman Behnam and Bahjat Forouzandeh and Bijan Alizadeh}, year = {2014}, doi = {10.1109/ISVLSI.2014.103}, url = {http://dx.doi.org/10.1109/ISVLSI.2014.103}, researchr = {https://researchr.org/publication/JanfazaBFA14}, cites = {0}, citedby = {0}, pages = {220-225}, booktitle = {IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014}, publisher = {IEEE}, }