Hybrid history-based test overlapping to reduce test application time - researchr publication authors

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Vahid Janfaza, Bahjat Forouzandeh, Payman Behnam, Mohammadreza Najafi. Hybrid history-based test overlapping to reduce test application time. In East-West Design & Test Symposium, EWDTS 2013, Rostov-on-Don, Russia, September 27-30, 2013. pages 1-4, IEEE, 2013. [doi]

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