Hybrid history-based test overlapping to reduce test application time

Vahid Janfaza, Bahjat Forouzandeh, Payman Behnam, Mohammadreza Najafi. Hybrid history-based test overlapping to reduce test application time. In East-West Design & Test Symposium, EWDTS 2013, Rostov-on-Don, Russia, September 27-30, 2013. pages 1-4, IEEE, 2013. [doi]

@inproceedings{JanfazaFBN13,
  title = {Hybrid history-based test overlapping to reduce test application time},
  author = {Vahid Janfaza and Bahjat Forouzandeh and Payman Behnam and Mohammadreza Najafi},
  year = {2013},
  doi = {10.1109/EWDTS.2013.6673084},
  url = {http://dx.doi.org/10.1109/EWDTS.2013.6673084},
  researchr = {https://researchr.org/publication/JanfazaFBN13},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {East-West Design & Test Symposium, EWDTS 2013, Rostov-on-Don, Russia, September 27-30, 2013},
  publisher = {IEEE},
}