Delay Defect Diagnosis Methodology Using Path Delay Measurements

Eun-jung Jang, Jaeyong Chung, Jacob A. Abraham. Delay Defect Diagnosis Methodology Using Path Delay Measurements. IEICE Transactions, 98-C(10):991-994, 2015. [doi]

Authors

Eun-jung Jang

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Jaeyong Chung

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Jacob A. Abraham

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