Eun-jung Jang, Jaeyong Chung, Jacob A. Abraham. Delay Defect Diagnosis Methodology Using Path Delay Measurements. IEICE Transactions, 98-C(10):991-994, 2015. [doi]
@article{JangCA15,
title = {Delay Defect Diagnosis Methodology Using Path Delay Measurements},
author = {Eun-jung Jang and Jaeyong Chung and Jacob A. Abraham},
year = {2015},
url = {http://search.ieice.org/bin/summary.php?id=e98-c_10_991},
researchr = {https://researchr.org/publication/JangCA15},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {98-C},
number = {10},
pages = {991-994},
}