Jaeeun Jang, Minseo Kim, Joonsung Bae, Hoi-Jun Yoo. A 2.79-mW 0.5%-THD CMOS current driver IC for portable electrical impedance tomography system. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2017, Seoul, Korea (South), November 6-8, 2017. pages 145-148, IEEE, 2017. [doi]
@inproceedings{JangKBY17,
title = {A 2.79-mW 0.5%-THD CMOS current driver IC for portable electrical impedance tomography system},
author = {Jaeeun Jang and Minseo Kim and Joonsung Bae and Hoi-Jun Yoo},
year = {2017},
doi = {10.1109/ASSCC.2017.8240237},
url = {https://doi.org/10.1109/ASSCC.2017.8240237},
researchr = {https://researchr.org/publication/JangKBY17},
cites = {0},
citedby = {0},
pages = {145-148},
booktitle = {IEEE Asian Solid-State Circuits Conference, A-SSCC 2017, Seoul, Korea (South), November 6-8, 2017},
publisher = {IEEE},
isbn = {978-1-5386-3178-2},
}