f Noise, Hot Carrier and NBTI Reliability of MOSFETs

Jae-Hyung Jang, Hyuk-Min Kwon, Ho-Young Kwak, Sung-Kyu Kwon, Seon-Man Hwang, Jong-Kwan Shin, Seung-Yong Sung, Yi-Sun Chung, Da-Soon Lee, Hi-Deok Lee. f Noise, Hot Carrier and NBTI Reliability of MOSFETs. IEICE Transactions, 96-C(5):624-629, 2013. [doi]

Abstract

Abstract is missing.