B. Jang, Y-B. Kim, F. Lombardi. Error rate reduction in DNA self-assembly by non-constant monomer concentrations and profiling. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 847-852, ACM, 2007. [doi]
@inproceedings{JangKL07:0,
title = {Error rate reduction in DNA self-assembly by non-constant monomer concentrations and profiling},
author = {B. Jang and Y-B. Kim and F. Lombardi},
year = {2007},
doi = {10.1145/1266366.1266550},
url = {http://doi.acm.org/10.1145/1266366.1266550},
researchr = {https://researchr.org/publication/JangKL07%3A0},
cites = {0},
citedby = {0},
pages = {847-852},
booktitle = {2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France},
editor = {Rudy Lauwereins and Jan Madsen},
publisher = {ACM},
isbn = {978-3-9810801-2-4},
}