Sun Young Jang, Ho Kyung Kim, Hanbean Youn, Seungryong Cho, Ian A. Cunningham. Fourier Analysis of Noise Characteristics in Cone-Beam Microtomography Laboratory Scanners. IEEE Trans. Biomed. Engineering, 64(1):173-183, 2017. [doi]
@article{JangKYCC17,
title = {Fourier Analysis of Noise Characteristics in Cone-Beam Microtomography Laboratory Scanners},
author = {Sun Young Jang and Ho Kyung Kim and Hanbean Youn and Seungryong Cho and Ian A. Cunningham},
year = {2017},
doi = {10.1109/TBME.2016.2552496},
url = {http://dx.doi.org/10.1109/TBME.2016.2552496},
researchr = {https://researchr.org/publication/JangKYCC17},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Biomed. Engineering},
volume = {64},
number = {1},
pages = {173-183},
}