Fourier Analysis of Noise Characteristics in Cone-Beam Microtomography Laboratory Scanners

Sun Young Jang, Ho Kyung Kim, Hanbean Youn, Seungryong Cho, Ian A. Cunningham. Fourier Analysis of Noise Characteristics in Cone-Beam Microtomography Laboratory Scanners. IEEE Trans. Biomed. Engineering, 64(1):173-183, 2017. [doi]

Abstract

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