Changsoo Jang, SeungBae Park, Bill Infantolino, Lawrence Lehman, Ryan Morgan, Dipak Sengupta. Failure analysis of contact probe pins for SnPb and Sn applications. Microelectronics Reliability, 48(6):942-947, 2008. [doi]
@article{JangPILMS08,
title = {Failure analysis of contact probe pins for SnPb and Sn applications},
author = {Changsoo Jang and SeungBae Park and Bill Infantolino and Lawrence Lehman and Ryan Morgan and Dipak Sengupta},
year = {2008},
doi = {10.1016/j.microrel.2008.03.015},
url = {http://dx.doi.org/10.1016/j.microrel.2008.03.015},
tags = {analysis},
researchr = {https://researchr.org/publication/JangPILMS08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {6},
pages = {942-947},
}