Failure analysis of contact probe pins for SnPb and Sn applications

Changsoo Jang, SeungBae Park, Bill Infantolino, Lawrence Lehman, Ryan Morgan, Dipak Sengupta. Failure analysis of contact probe pins for SnPb and Sn applications. Microelectronics Reliability, 48(6):942-947, 2008. [doi]

Abstract

Abstract is missing.