Chanhee Jang, Sang-Yun Yun, Hyejin Hwang, Hyunmin Shin, SeongSoo Kim, YangSub Park. A Defect Inspection Method for Machine Vision Using Defect Probability Image with Deep Convolutional Neural Network. In C. V. Jawahar, Hongdong Li, Greg Mori, Konrad Schindler, editors, Computer Vision - ACCV 2018 - 14th Asian Conference on Computer Vision, Perth, Australia, December 2-6, 2018, Revised Selected Papers, Part I. Volume 11361 of Lecture Notes in Computer Science, pages 142-154, Springer, 2018. [doi]
Abstract is missing.