Marcin Janicki, Tomasz Torzewicz, Agnieszka Samson, Tomasz Raszkowski, Artur Sobczak, Mariusz Zubert, Andrzej Napieralski. Experimental investigation of discrete air cooled device thermal resistance dependence on cooling conditions. Microelectronics Reliability, 79:405-409, 2017. [doi]
@article{JanickiTSRSZN17,
title = {Experimental investigation of discrete air cooled device thermal resistance dependence on cooling conditions},
author = {Marcin Janicki and Tomasz Torzewicz and Agnieszka Samson and Tomasz Raszkowski and Artur Sobczak and Mariusz Zubert and Andrzej Napieralski},
year = {2017},
doi = {10.1016/j.microrel.2017.05.008},
url = {https://doi.org/10.1016/j.microrel.2017.05.008},
researchr = {https://researchr.org/publication/JanickiTSRSZN17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {79},
pages = {405-409},
}