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Automatische Detektion von Wurzelsystemen in Minirhizotron-Bildern

M. Jankowski, S.-W. Breckle, Stefan Posch, Gerhard Sagerer, M. Veste. Automatische Detektion von Wurzelsystemen in Minirhizotron-Bildern. In Gerhard Sagerer, Stefan Posch, Franz Kummert, editors, Mustererkennung 1995, 17. DAGM-Symposium, Bielefeld, 13.-15. September 1995, Proceedings. Informatik Aktuell, pages 176-185, Springer, 1995.

Authors

M. Jankowski

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S.-W. Breckle

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Stefan Posch

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Gerhard Sagerer

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M. Veste

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