Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system

Eline Janssens, Jan De Beenhouwer, Mattias Van Dael, Pieter Verboven, Bart M. Nicolaï, Jan Sijbers. Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system. In 2015 IEEE International Conference on Image Processing, ICIP 2015, Quebec City, QC, Canada, September 27-30, 2015. pages 917-921, IEEE, 2015. [doi]

Abstract

Abstract is missing.