Jeroen H. M. Janssens, Ildikó Flesch, Eric O. Postma. Outlier Detection with One-Class Classifiers from ML and KDD. In M. Arif Wani, Mehmed M. Kantardzic, Vasile Palade, Lukasz A. Kurgan, Yuan Qi, editors, International Conference on Machine Learning and Applications, ICMLA 2009, Miami Beach, Florida, USA, December 13-15, 2009. pages 147-153, IEEE Computer Society, 2009. [doi]
@inproceedings{JanssensFP09,
title = {Outlier Detection with One-Class Classifiers from ML and KDD},
author = {Jeroen H. M. Janssens and Ildikó Flesch and Eric O. Postma},
year = {2009},
doi = {10.1109/ICMLA.2009.16},
url = {http://doi.ieeecomputersociety.org/10.1109/ICMLA.2009.16},
researchr = {https://researchr.org/publication/JanssensFP09},
cites = {0},
citedby = {0},
pages = {147-153},
booktitle = {International Conference on Machine Learning and Applications, ICMLA 2009, Miami Beach, Florida, USA, December 13-15, 2009},
editor = {M. Arif Wani and Mehmed M. Kantardzic and Vasile Palade and Lukasz A. Kurgan and Yuan Qi},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3926-3},
}