Juan Jaramillo, Artur Zarzycki, July Galeano Zea, Patrick Sandoz. Performance Characterization of an xy-Stage Applied to Micrometric Laser Direct Writing Lithography. Sensors, 17(2):278, 2017. [doi]
@article{JaramilloZZS17,
title = {Performance Characterization of an xy-Stage Applied to Micrometric Laser Direct Writing Lithography},
author = {Juan Jaramillo and Artur Zarzycki and July Galeano Zea and Patrick Sandoz},
year = {2017},
doi = {10.3390/s17020278},
url = {http://dx.doi.org/10.3390/s17020278},
researchr = {https://researchr.org/publication/JaramilloZZS17},
cites = {0},
citedby = {0},
journal = {Sensors},
volume = {17},
number = {2},
pages = {278},
}