A New Framework for Analyzing Test Generation and Diagnosis Algorithms for Wiring Interconnects - researchr publication

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Najmi T. Jarwala, Chi W. Yau. A New Framework for Analyzing Test Generation and Diagnosis Algorithms for Wiring Interconnects. In Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. pages 63-70, IEEE Computer Society, 1989.

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