Abhijit Jas, Bahram Pouya, Nur A. Touba. Virtual Scan Chains: A Means for Reducing Scan Length in Cores. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 73-78, IEEE Computer Society, 2000. [doi]
Abstract is missing.