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Automated software-based self-test generation for microprocessors

Artjom Jasnetski, Raimund Ubar, Anton Tsertov. Automated software-based self-test generation for microprocessors. In 24th International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2017, Bydgoszcz, Poland, June 22-24, 2017. pages 453-458, IEEE, 2017. [doi]

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Artjom Jasnetski

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Raimund Ubar

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Anton Tsertov

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