Artjom Jasnetski, Raimund Ubar, Anton Tsertov. Automated software-based self-test generation for microprocessors. In 24th International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2017, Bydgoszcz, Poland, June 22-24, 2017. pages 453-458, IEEE, 2017. [doi]
Abstract is missing.