M. Reza Javaheri, Reza Sedaghat. A Novel Delay Fault Testing Methodology for Resistive Faults in Deep Sub-micron Technologies. In Hamid Sarbazi-Azad, Behrooz Parhami, Seyed Ghassem Miremadi, Shaahin Hessabi, editors, Advances in Computer Science and Engineering - 13th International CSI Computer Conference, CSICC 2008, Kish Island, Iran, March 9-11, 2008 Revised Selected Papers. Volume 6 of Communications in Computer and Information Science, pages 653-660, 2008. [doi]
Abstract is missing.