M. Reza Javaheri, Reza Sedaghat. Multi-valued logic mapping of resistive short and open delay-fault testing in deep sub-micron technologies. Microelectronics Reliability, 49(2):178-185, 2009. [doi]
@article{JavaheriS09,
title = {Multi-valued logic mapping of resistive short and open delay-fault testing in deep sub-micron technologies},
author = {M. Reza Javaheri and Reza Sedaghat},
year = {2009},
doi = {10.1016/j.microrel.2008.11.010},
url = {http://dx.doi.org/10.1016/j.microrel.2008.11.010},
tags = {testing, source-to-source, logic, open-source},
researchr = {https://researchr.org/publication/JavaheriS09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {2},
pages = {178-185},
}