Tanuja Jayas, Adarsh A, Kartik Muralidharan, Jayavardhana Gubbi, Ramesh Kumar R., Arpan Pal 0001. Computer Aided Detection of Dominant Artifacts in Ear-EEG Signal. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2023, Honolulu, Oahu, HI, USA, October 1-4, 2023. pages 4423-4428, IEEE, 2023. [doi]
Abstract is missing.