Statistical analysis of Multiple Transform Selection in VVC test model (VTM)

Sonda Ben Jdidia, Fatma Belghith, Nouri Masmoudi. Statistical analysis of Multiple Transform Selection in VVC test model (VTM). In 20th International Multi-Conference on Systems, Signals & Devices, SSD 2023, Mahdia, Tunisia, February 20-23, 2023. pages 408-413, IEEE, 2023. [doi]

Authors

Sonda Ben Jdidia

This author has not been identified. Look up 'Sonda Ben Jdidia' in Google

Fatma Belghith

This author has not been identified. Look up 'Fatma Belghith' in Google

Nouri Masmoudi

This author has not been identified. Look up 'Nouri Masmoudi' in Google