Sonda Ben Jdidia, Fatma Belghith, Nouri Masmoudi. Statistical analysis of Multiple Transform Selection in VVC test model (VTM). In 20th International Multi-Conference on Systems, Signals & Devices, SSD 2023, Mahdia, Tunisia, February 20-23, 2023. pages 408-413, IEEE, 2023. [doi]
Abstract is missing.