Jong-Hann Jean, Chia-Hong Chen, Hsiu-Li Lin. Application of an image processing software tool to crack inspection of crystalline silicon solar cells. In International Conference on Machine Learning and Cybernetics, ICMLC 2011, Guilin, China, July 10-13, 2011, Proceedings. pages 1666-1671, IEEE, 2011. [doi]
Abstract is missing.