Reiner Jedermann, Jean-Pierre Emond, Walter Lang. Shelf Life Prediction by Intelligent RFID - Technical Limits of Model Accuracy. In Hans-Jörg Kreowski, Bernd Scholz-Reiter, Hans-Dietrich Haasis, editors, Dynamics in Logistics, First International Conference, LDIC 2007, Bremen, Germany, August 2007, Proceedings. pages 231-238, Springer, 2007. [doi]
@inproceedings{JedermannEL07,
title = {Shelf Life Prediction by Intelligent RFID - Technical Limits of Model Accuracy},
author = {Reiner Jedermann and Jean-Pierre Emond and Walter Lang},
year = {2007},
doi = {10.1007/978-3-540-76862-3_22},
url = {https://doi.org/10.1007/978-3-540-76862-3_22},
researchr = {https://researchr.org/publication/JedermannEL07},
cites = {0},
citedby = {0},
pages = {231-238},
booktitle = {Dynamics in Logistics, First International Conference, LDIC 2007, Bremen, Germany, August 2007, Proceedings},
editor = {Hans-Jörg Kreowski and Bernd Scholz-Reiter and Hans-Dietrich Haasis},
publisher = {Springer},
isbn = {978-3-540-76862-3},
}