Reiner Jedermann, Jean-Pierre Emond, Walter Lang. Shelf Life Prediction by Intelligent RFID - Technical Limits of Model Accuracy. In Hans-Jörg Kreowski, Bernd Scholz-Reiter, Hans-Dietrich Haasis, editors, Dynamics in Logistics, First International Conference, LDIC 2007, Bremen, Germany, August 2007, Proceedings. pages 231-238, Springer, 2007. [doi]
Abstract is missing.