Alvin Jee. Defect-Oriented Analysis of Memory BIST Tests. In 10th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor, France. pages 7-11, IEEE Computer Society, 2002. [doi]
@inproceedings{Jee02:0,
title = {Defect-Oriented Analysis of Memory BIST Tests},
author = {Alvin Jee},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/mtdt/2002/1617/00/16170007abs.htm},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/Jee02%3A0},
cites = {0},
citedby = {0},
pages = {7-11},
booktitle = {10th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-1617-3},
}