Alvin Jee. Defect-Oriented Analysis of Memory BIST Tests. In 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France. pages 201-205, IEEE Computer Society, 2002. [doi]
@inproceedings{Jee02,
title = {Defect-Oriented Analysis of Memory BIST Tests},
author = {Alvin Jee},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/ioltw/2002/1641/00/16410201abs.htm},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/Jee02},
cites = {0},
citedby = {0},
pages = {201-205},
booktitle = {8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-1641-6},
}