Alvin Jee, F. Joel Ferguson. Carafe: an inductive fault analysis tool for CMOS VLSI circuits. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 92-98, IEEE, 1993. [doi]
@inproceedings{JeeF93,
title = {Carafe: an inductive fault analysis tool for CMOS VLSI circuits},
author = {Alvin Jee and F. Joel Ferguson},
year = {1993},
doi = {10.1109/VTEST.1993.313302},
url = {http://dx.doi.org/10.1109/VTEST.1993.313302},
researchr = {https://researchr.org/publication/JeeF93},
cites = {0},
citedby = {0},
pages = {92-98},
booktitle = {11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA},
publisher = {IEEE},
isbn = {0-8186-3830-3},
}