Pattern Recognition Framework for Histological Slide Segmentation

Lukasz Jelen, Michal Kulus, Tomasz Jurek. Pattern Recognition Framework for Histological Slide Segmentation. In Khalid Saeed, Wladyslaw Homenda, editors, Computer Information Systems and Industrial Management - 17th International Conference, CISIM 2018, Olomouc, Czech Republic, September 27-29, 2018, Proceedings. Volume 11127 of Lecture Notes in Computer Science, pages 37-45, Springer, 2018. [doi]

Abstract

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