Tom Jeleniewski, Hamied Nabizada, Jonathan Tobias Reif, Aljosha Köcher, Alexander Fay. A Semantic Model to Express Process Parameters and their Interdependencies in Manufacturing. In 32nd IEEE International Symposium on Industrial Electronics, ISIE 2023, Helsinki, Finland, June 19-21, 2023. pages 1-6, IEEE, 2023. [doi]
@inproceedings{JeleniewskiNRKF23,
title = {A Semantic Model to Express Process Parameters and their Interdependencies in Manufacturing},
author = {Tom Jeleniewski and Hamied Nabizada and Jonathan Tobias Reif and Aljosha Köcher and Alexander Fay},
year = {2023},
doi = {10.1109/ISIE51358.2023.10228021},
url = {https://doi.org/10.1109/ISIE51358.2023.10228021},
researchr = {https://researchr.org/publication/JeleniewskiNRKF23},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {32nd IEEE International Symposium on Industrial Electronics, ISIE 2023, Helsinki, Finland, June 19-21, 2023},
publisher = {IEEE},
isbn = {979-8-3503-9971-4},
}