Tom Jeleniewski, Hamied Nabizada, Jonathan Tobias Reif, Aljosha Köcher, Alexander Fay. A Semantic Model to Express Process Parameters and their Interdependencies in Manufacturing. In 32nd IEEE International Symposium on Industrial Electronics, ISIE 2023, Helsinki, Finland, June 19-21, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.