MuDer Jeng, Xiaolan Xie, Sheng-Luen Chung. ERCN* merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 34(1):102-112, 2004. [doi]
@article{JengXC04,
title = {ERCN* merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems},
author = {MuDer Jeng and Xiaolan Xie and Sheng-Luen Chung},
year = {2004},
doi = {10.1109/TSMCA.2003.820579},
url = {http://doi.ieeecomputersociety.org/10.1109/TSMCA.2003.820579},
tags = {modeling, process modeling},
researchr = {https://researchr.org/publication/JengXC04},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Systems, Man, and Cybernetics, Part A},
volume = {34},
number = {1},
pages = {102-112},
}