Myeongwoon Jeon, Sungkyu Chung, Beomju Shin, Jungwoo Lee 0001. Limited magnitude error locating parity check codes for flash memories. In 55th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2012, Boise, ID, USA, August 5-8, 2012. pages 29-32, IEEE, 2012. [doi]
@inproceedings{JeonCS012,
title = {Limited magnitude error locating parity check codes for flash memories},
author = {Myeongwoon Jeon and Sungkyu Chung and Beomju Shin and Jungwoo Lee 0001},
year = {2012},
doi = {10.1109/MWSCAS.2012.6291949},
url = {https://doi.org/10.1109/MWSCAS.2012.6291949},
researchr = {https://researchr.org/publication/JeonCS012},
cites = {0},
citedby = {0},
pages = {29-32},
booktitle = {55th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2012, Boise, ID, USA, August 5-8, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2526-4},
}