Myeongwoon Jeon, Sungkyu Chung, Beomju Shin, Jungwoo Lee 0001. Limited magnitude error locating parity check codes for flash memories. In 55th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2012, Boise, ID, USA, August 5-8, 2012. pages 29-32, IEEE, 2012. [doi]
Abstract is missing.