Deokmin Jeon, Unsang Jung, Kibeom Park, Pilun Kim, Sangyeob Han, Hyosang Jeong, Ruchire Eranga Wijesinghe, Naresh Kumar Ravichandran, Jaeyul Lee, Youngmin Han, Mansik Jeon, Jeehyun Kim. Vision-Inspection-Synchronized Dual Optical Coherence Tomography for High-Resolution Real-Time Multidimensional Defect Tracking in Optical Thin Film Industry. IEEE Access, 8:190700-190709, 2020. [doi]
Abstract is missing.