Duhyun Jeon, Dongmin Lee, Dong Kyue Kim, Byong-Deok Choi. Contact PUF: Highly Stable Physical Unclonable Functions Based on Contact Failure Probability in 180 nm, 130 nm, and 28 nm CMOS Processes. In IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2022, McLean, VA, USA, June 27-30, 2022. pages 85-88, IEEE, 2022. [doi]
Abstract is missing.