Insu Jeon, Young-Bae Park. Analysis of the reservoir effect on electromigration reliability. Microelectronics Reliability, 44(6):917-928, 2004. [doi]
@article{JeonP04,
title = {Analysis of the reservoir effect on electromigration reliability},
author = {Insu Jeon and Young-Bae Park},
year = {2004},
doi = {10.1016/j.microrel.2004.02.001},
url = {http://dx.doi.org/10.1016/j.microrel.2004.02.001},
tags = {analysis, reliability},
researchr = {https://researchr.org/publication/JeonP04},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {44},
number = {6},
pages = {917-928},
}