Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Insu Jeon, Young-Bae Park. Analysis of the reservoir effect on electromigration reliability. Microelectronics Reliability, 44(6):917-928, 2004. [doi]
No references recorded for this publication.
No citations of this publication recorded.