A 16nm configurable pass-gate bit-cell register file for quantifying the VMIN advantage of PFET versus NFET pass-gate bit cells - researchr publication authors

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Jihoon Jeong, Francois Atallah, Hoan Nguyen, Josh Puckett, Keith A. Bowman, David Hansquine. A 16nm configurable pass-gate bit-cell register file for quantifying the VMIN advantage of PFET versus NFET pass-gate bit cells. In 2015 IEEE Custom Integrated Circuits Conference, CICC 2015, San Jose, CA, USA, September 28-30, 2015. pages 1-4, IEEE, 2015. [doi]

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