Field Failure Mechanism Investigation of GaAs based HBT Power Amplifier Mmodule (PAM)

Jae-Seong Jeong, Jong-Shin Ha, Sang-Deuk Park. Field Failure Mechanism Investigation of GaAs based HBT Power Amplifier Mmodule (PAM). Microelectronics Reliability, 44(9-11):1393-1398, 2004. [doi]

Abstract

Abstract is missing.